Characterization of solar cell passivating contacts using time-of-flight elastic recoil detection analysis by Shi, Y, Wright, M, Sharpe, MK, McAleese, CD, Polzin, J-I, Niu, X, Zhao, Z, Morris, S, Bonilla Osorio, RS

Taking monocrystalline silicon to the ultimate lifetime limit by Niewelt, T, Richter, A, Kho, T, Grant, N, Bonilla, R, Steinhauser, B, Polzin, J, Feldmann, F, Hermle, M, Murphy, J, Phang, S, Kwapil, W, Schubert, M

Data for Towards Accurate Atom Scale Characterisation of Hydrogen Passivation of Interfaces in TOPCon Architectures by Shi, Y, Jones, M E, Meier, M S, Wright, M, Polzin, J, Kwapil, W, Fischer, C, Schubert, M C, Grovenor, C, Moody, M, Bonilla, R S

Towards accurate atom scale characterisation of hydrogen passivation of interfaces in TOPCon architectures by Shi, Y, Jones, ME, Meier, MS, Wright, M, Polzin, J-A, Kwapil. W, Fischer, C, Schubert, MC, Grovenor, C, Moody, M, Bonilla, RS, Bonilla Osorio, RS