Showing 1 - 20 results of 23 for search 'Prasad, Krishnamachar.', query time: 0.03s Refine Results
  1. 1
    Development of photolithography for the fabrication of novel GaAs based devices and diamond-like film based devices

    Development of photolithography for the fabrication of novel GaAs based devices and diamond-like film based devices by Prasad Krishnamachar.

    Published 2011
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    Research Report
  2. 2
    Fabrication and characterization of microelectronic devices, circuits and systems IV

    Fabrication and characterization of microelectronic devices, circuits and systems IV by Chan, Pak Kwong., Prasad, Krishnamachar.

    Published 2008
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    Research Report
  3. 3
    A system health indicator for the distributed minority and majority voting based redundancy scheme

    A system health indicator for the distributed minority and majority voting based redundancy scheme by Balasubramanian, Padmanabhan, Maskell, Douglas, Prasad, Krishnamachar

    Published 2020
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    Conference Paper
  4. 4
    RESAC: a redundancy strategy involving approximate computing for error-tolerant applications

    RESAC: a redundancy strategy involving approximate computing for error-tolerant applications by Balasubramanian, Padmanabhan, Maskell, Douglas Leslie, Prasad, Krishnamachar

    Published 2024
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    Journal Article
  5. 5
    Development of deep submicron HEMT MMIC for millimetre-wave applications

    Development of deep submicron HEMT MMIC for millimetre-wave applications by Ng, Geok Eng, Yuan, Xiaocong, Yoon, Soon Fatt, Radhakrishnan, K., Law, Choi Look, Ooi, Boon Siew, Prasad Krishnamachar

    Published 2008
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    Research Report
  6. 6
    Fabrication and characterization of microelectronic devices, circuits and systems VI

    Fabrication and characterization of microelectronic devices, circuits and systems VI by Radhakrishnan, K.

    Published 2008
    Other Authors: “…Prasad, Krishnamachar…”
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    Research Report
  7. 7
    Source line resistance failure issues and process optimisation of self aligned source etch

    Source line resistance failure issues and process optimisation of self aligned source etch by Su, Julia Hui Fong.

    Published 2008
    Other Authors: “…Prasad, Krishnamachar…”
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    Thesis
  8. 8
    Electromigration reliability of copper interconnect in submicron microelectronics application

    Electromigration reliability of copper interconnect in submicron microelectronics application by Ang, Kian Ann

    Published 2008
    Other Authors: “…Prasad, Krishnamachar…”
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    Thesis
  9. 9
    Device "S" leakage failure due to plasma damage

    Device "S" leakage failure due to plasma damage by Tan, Siew Yoon.

    Published 2008
    Other Authors: “…Prasad, Krishnamachar…”
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    Thesis
  10. 10
    Characterization of deep trench etch recipe

    Characterization of deep trench etch recipe by Tay, Chin Tiong.

    Published 2008
    Other Authors: “…Prasad, Krishnamachar…”
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    Thesis
  11. 11
    Stress measurement in copper films

    Stress measurement in copper films by Teo, Chee Hiang.

    Published 2008
    Other Authors: “…Prasad, Krishnamachar…”
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    Thesis
  12. 12
    Experimental study of copper contamination in VLSI technology

    Experimental study of copper contamination in VLSI technology by Tey, Shih Hwee.

    Published 2008
    Other Authors: “…Prasad, Krishnamachar…”
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    Thesis
  13. 13
    Significance of process exhaust system on wafer fab operation and its performance improvement

    Significance of process exhaust system on wafer fab operation and its performance improvement by Vedachalam Natanasabapathy

    Published 2008
    Other Authors: “…Prasad, Krishnamachar…”
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    Thesis
  14. 14
    Improvement in speed performance through transistor process optimization

    Improvement in speed performance through transistor process optimization by Zheng, You.

    Published 2008
    Other Authors: “…Prasad, Krishnamachar…”
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    Thesis
  15. 15
    Characterization and reliability studies of oxides grown by wet and dry oxidations for 0.25 micrometer CMOS technology

    Characterization and reliability studies of oxides grown by wet and dry oxidations for 0.25 micrometer CMOS technology by Chow, Yew Tuck.

    Published 2008
    Other Authors: “…Prasad, Krishnamachar…”
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    Thesis
  16. 16
    Improvement of contact resistance through barrier metallization optimization

    Improvement of contact resistance through barrier metallization optimization by Goh, Edwin Beng Chye.

    Published 2008
    Other Authors: “…Prasad, Krishnamachar…”
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    Thesis
  17. 17
    Process capability index (CPK) improvement for NMOS transistor IDSAT of 0.3 micrometer technology

    Process capability index (CPK) improvement for NMOS transistor IDSAT of 0.3 micrometer technology by Goh, Beng Lee.

    Published 2008
    Other Authors: “…Prasad, Krishnamachar…”
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    Thesis
  18. 18
    Characteristics of chemical mechanical polishing in advanced wafer processing

    Characteristics of chemical mechanical polishing in advanced wafer processing by Huang, Wen Ke.

    Published 2008
    Other Authors: “…Prasad, Krishnamachar…”
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    Thesis
  19. 19
    Study and characterization of low dielectric constant materials for interlayer dielectric applications

    Study and characterization of low dielectric constant materials for interlayer dielectric applications by Narayanan, Babu

    Published 2008
    Other Authors: “…Prasad, Krishnamachar…”
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    Thesis
  20. 20
    Influence of cleaning process on gate oxide integrity

    Influence of cleaning process on gate oxide integrity by Liu, Qing Guang.

    Published 2008
    Other Authors: “…Prasad, Krishnamachar…”
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    Thesis

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