Nanoscale characterization of metal/dielectric/semiconductor interfaces using ballistic electron emission microscopy за авторством Qin, Hailang

Отримати повний текст

Effect of surface contamination on electron tunneling in the high bias range за авторством Qin, Hailang, Goh, Johnson Kuan Eng, Bosman, Michel, Li, Xiang, Pey, Kin Leong, Troadec, Cedric

Отримати повний текст
Отримати повний текст

Barrier height determination of Au/Oxidized GaAs/n-GaAs using ballistic electron emission spectroscopy за авторством Bosman, Michel, Ong, Beng Sheng, Chiam, Sing Yang, Pey, Kin Leong, Qin, Hailang, Liu, Zhiqiang, Troadec, Cedric, Goh, Johnson Kuan Eng

Отримати повний текст
Отримати повний текст

Chiral kagome superconductivity modulations with residual Fermi arcs за авторством Deng, Hanbin, Qin, Hailang, Liu, Guowei, Yang, Tianyu, Fu, Ruiqing, Zhang, Zhongyi, Wu, Xianxin, Wang, Zhiwei, Shi, Youguo, Liu, Jinjin, Liu, Hongxiong, Yan, Xiao-Yu, Song, Wei, Xu, Xitong, Zhao, Yuanyuan, Yi, Mingsheng, Xu, Gang, Hohmann, Hendrik, Holbæk, Sofie Castro, Dürrnagel, Matteo, Zhou, Sen, Chang, Guoqing, Yao, Yugui, Wang, Qianghua, Guguchia, Zurab, Neupert, Titus, Thomale, Ronny, Fischer, Mark H., Yin, Jia-Xin

Отримати повний текст

Evidence for time-reversal symmetry-breaking kagome superconductivity за авторством Deng, Hanbin, Liu, Guowei, Guguchia, Z., Yang, Tianyu, Liu, Jinjin, Wang, Zhiwei, Xie, Yaofeng, Shao, Sen, Ma, Haiyang, Liège, William, Bourdarot, Frédéric, Yan, Xiao-Yu, Qin, Hailang, Mielke, C., Khasanov, R., Luetkens, H., Wu, Xianxin, Chang, Guoqing, Liu, Jianpeng, Christensen, Morten Holm, Kreisel, Andreas, Andersen, Brian Møller, Huang, Wen, Zhao, Yue, Bourges, Philippe, Yao, Yugui, Dai, Pengcheng, Yin, Jia-Xin

Отримати повний текст