Showing 1 - 2 results of 2 for search 'Rémy Leblanc', query time: 0.02s Refine Results
  1. 1
    Linear Characterization and Modeling of GaN-on-Si HEMT Technologies with 100 nm and 60 nm Gate Lengths

    Linear Characterization and Modeling of GaN-on-Si HEMT Technologies with 100 nm and 60 nm Gate Lengths by Sergio Colangeli, Walter Ciccognani, Patrick Ettore Longhi, Lorenzo Pace, Julien Poulain, Rémy Leblanc, Ernesto Limiti

    Published 2021-01-01
    Get full text
    Article
  2. 2
    Source/Load-Pull Noise Measurements at K<sub>a</sub> Band

    Source/Load-Pull Noise Measurements at K<sub>a</sub> Band by Sergio Colangeli, Walter Ciccognani, Patrick Ettore Longhi, Lorenzo Pace, Antonio Serino, Julien Poulain, Rémy Leblanc, Ernesto Limiti

    Published 2021-09-01
    Get full text
    Article

Search Tools: