Phase transition lowering in dynamically compressed silicon by McBride, E, Krygier, A, Ehnes, A, Galtier, E, Harmand, M, Konôpková, Z, Lee, H, Liermann, H, Nagler, B, Pelka, A, Rödel, M, Schropp, A, Smith, R, Spindloe, C, Swift, D, Tavella, F, Toleikis, S, Tschentscher, T, Wark, J, Higginbotham, A

Simultaneous 8.2 keV phase-contrast imaging and 24.6 keV X-ray diffraction from shock-compressed matter at the LCLS by Seiboth, F, Fletcher, L, McGonegle, D, Anzellini, S, Dresselhaus-Cooper, L, Frost, M, Galtier, E, Goede, S, Harmand, M, Lee, H, Levitan, A, Miyanishi, K, Nagler, B, Nam, I, Ozaki, N, Rodel, M, Schropp, A, Spindloe, C, Sun, P, Wark, J, Hastings, J, Glenzer, S, McBride, E