Thickness-dependent electron–lattice equilibration in laser-excited thin bismuth films by K Sokolowski-Tinten, R K Li, A H Reid, S P Weathersby, F Quirin, T Chase, R Coffee, J Corbett, A Fry, N Hartmann, C Hast, R Hettel, M Horn von Hoegen, D Janoschka, J R Lewandowski, M Ligges, F Meyer zu Heringdorf, X Shen, T Vecchione, C Witt, J Wu, H A Dürr, X J Wang

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