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    Using internal standards in time-resolved X-ray micro-computed tomography to quantify grain-scale developments in solid-state mineral reactions

    Using internal standards in time-resolved X-ray micro-computed tomography to quantify grain-scale developments in solid-state mineral reactions by R. E. Rizzo, R. E. Rizzo, D. Freitas, D. Freitas, J. Gilgannon, S. Seth, I. B. Butler, G. E. McGill, G. E. McGill, F. Fusseis, F. Fusseis

    Published 2024-04-01
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