Atomic-scale study of the amorphous-to-crystalline phase transition mechanism in GeTe thin films gan R. Mantovan, R. Fallica, A. Mokhles Gerami, T. E. Mølholt, C. Wiemer, M. Longo, H. P. Gunnlaugsson, K. Johnston, H. Masenda, D. Naidoo, M. Ncube, K. Bharuth-Ram, M. Fanciulli, H. P. Gislason, G. Langouche, S. Ólafsson, G. Weyer

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