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  1. 1
    Study of reactive electron beam deposited tantalum penta oxide thin films with spectroscopic ellipsometry and atomic force microscopy

    Study of reactive electron beam deposited tantalum penta oxide thin films with spectroscopic ellipsometry and atomic force microscopy by R.B. Tokas, S. Jena, C. Prathap, S. Thakur, K. Divakar Rao, D.V. Udupa

    Published 2023-12-01
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    Article
  2. 2
    Micro-structural characterization of low resistive metallic Ni germanide growth on annealing of Ni-Ge multilayer

    Micro-structural characterization of low resistive metallic Ni germanide growth on annealing of Ni-Ge multilayer by Mitali Swain, Surendra Singh, Debarati Bhattacharya, Ajay Singh, R.B. Tokas, C. L. Prajapat, Saibal Basu

    Published 2015-07-01
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