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Identification of Buffer and Surface Traps in Fe-Doped AlGaN/GaN HEMTs Using <i>Y<sub>21</sub></i> Frequency Dispersion Properties by P. Vigneshwara Raja, Nandha Kumar Subramani, Florent Gaillard, Mohamed Bouslama, Raphaël Sommet, Jean-Christophe Nallatamby
Published 2021-12-01
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