Diffraction contrast tomography of polycrystalline alumina by Marrow, T, King, A, Reischig, P, Rolland Du Roscoat, S, Ludwig, W

Non-destructive analysis of micro texture and grain boundary character from X-ray diffraction contrast tomography by King, A, Herbig, M, Ludwig, W, Reischig, P, Lauridsen, E, Marrow, T, Buffiere, J

Three-dimensional grain mapping by x-ray diffraction contrast tomography and the use of Friedel pairs in diffraction data analysis. by Ludwig, W, Reischig, P, King, A, Herbig, M, Lauridsen, E, Johnson, G, Marrow, T, Buffière, J

3-D growth of a short fatigue crack within a polycrystalline microstructure studied using combined diffraction and phase-contrast X-ray tomography by Herbig, M, King, A, Reischig, P, Proudhon, H, Lauridsen, E, Marrow, J, Buffiere, J, Ludwig, W

The three-dimensional microstructure of polycrystalline materials unravelled by synchrotron light by Ludwig, W, King, A, Herbig, M, Reischig, P, Marrow, J, Babout, L, Proudhon, H, Lauridsen, E, Buffière, J

Characterization of Polycrystalline Materials Using Synchrotron X-ray Imaging and Diffraction Techniques by Ludwig, W, King, A, Herbig, M, Reischig, P, Marrow, J, Babout, L, Lauridsen, E, Proudhon, H, Buffiere, J

The three-dimensional microstructure of polycrystalline materials unravelled by synchrotron light by Ludwig, W, King, A, Herbig, M, Reischig, P, Marrow, J, Babout, L, Proudhon, H, Lauridsen, E, Buffiere, J

Three-dimensional observation and image-based modelling of thermal strains in polycrystalline alumina by Gonzalez, D, King, A, Mostafavi, M, Reischig, P, Rolland Du Roscoat, S, Ludwig, W, Quinta Da Fonseca, J, Withers, P, Marrow, T, Marrow, T

New opportunities for 3D materials science of polycrystalline materials at the micrometre lengthscale by combined use of X-ray diffraction and X-ray imaging by Ludwig, W, King, A, Reischig, P, Herbig, M, Lauridsen, E, Schmidt, S, Proudhon, H, Forest, S, Cloetens, P, Roscoat, S, Buffière, J, Marrow, T, Poulsen, H

New opportunities for 3D materials science of polycrystalline materials at the micrometre lengthscale by combined use of X-ray diffraction and X-ray imaging by Ludwig, W, King, A, Reischig, P, Herbig, M, Lauridsen, E, Schmidt, S, Proudhon, H, Forest, S, Cloetens, P, Roscoat, d, Buffiere, J, Marrow, T, Poulsen, H