Development of microstructure in T1-2212 thin films and possible influence on microwave surface resistance values by Speller, S, Wu, H, Rek, Z, Bilello, J, Grovenor, C

High resolution x-ray characterization of Tl-2212 superconducting thin films by Daniels, M, Bilello, J, Rek, Z, Hyland, D, Dew-Hughes, D, Grovenor, C