Showing 1 - 4 results of 4 for search 'Rohit Kapur', query time: 0.02s Refine Results
  1. 1
    CTL for test information of digital ICs /

    CTL for test information of digital ICs / by 241383 Rohit Kapur

    Published 2003
  2. 2
    Aggressive Exclusion of Scan Flip-Flops from Compression Architecture for Better Coverage and Reduced TDV: A Hybrid Approach

    Aggressive Exclusion of Scan Flip-Flops from Compression Architecture for Better Coverage and Reduced TDV: A Hybrid Approach by Pralhadrao V. Shantagiri, Rohit Kapur

    Published 2019-05-01
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    Article
  3. 3
    New scan compression approach to reduce the test data volume

    New scan compression approach to reduce the test data volume by Pralhadrao V. Shantagiri, Rohit Kapur, Chandrasekar Shastry

    Published 2021-07-01
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    Article
  4. 4
    A reconfigurable shared scan-in architecture

    A reconfigurable shared scan-in architecture by Samaranayake, Samitha, 1978-

    Published 2014
    Other Authors: “…Rohit Kapur and Volker Strumpen.…”
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    Thesis

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