Strength of shock-loaded single-crystal tantalum [100] determined using in situ broadband x-ray Laue diffraction. by Comley, A, Maddox, B, Rudd, R, Prisbrey, S, Hawreliak, J, Orlikowski, D, Peterson, S, Satcher, J, Elsholz, A, Park, H, Remington, B, Bazin, N, Foster, J, Graham, P, Park, N, Rosen, P, Rothman, SR, Higginbotham, A, Suggit, M, Wark, J