Misfit dislocations generated from inhomogeneous sources and their critical thicknesses in a InGaAs/GaAs heterostructure grown by molecular beam epitaxy by Zou, J, Cockayne, D, RussellHarriott, J

Inhomogeneous sources of misfit dislocation generation in InxGa1-xAs/GaAs strained-layer heterostructures grown by molecular beam epitaxy by Zou, J, Cockayne, D, RussellHarriott, J, Moon, A

Investigation of oval defects in InGaAs/GaAs strained-layer heterostructures using cathodoluminescence and wavelength dispersive spectroscopy by Russell-Harriott, J, Zou, J, Moon, A, Cockayne, D, Usher, B

Cathodoluminescence study of oval defects in MBE grown InGaAs/GaAs by RussellHarriott, J, Zou, J, Cockayne, D, Moon, A, Usher, B

Oval defects in InGaAs/GaAs heterostructures by Russell-Harriott, J, Zou, J, Moon, A, Cockayne, D, Usher, B