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  1. 1
    Filament Formation in TaOx Thin Films for Memristor Device Application: Modeling Electron Energy Loss Spectra and Electron Transport

    Filament Formation in TaOx Thin Films for Memristor Device Application: Modeling Electron Energy Loss Spectra and Electron Transport by Jie Jiang, Ruth Pachter, Krishnamurthy Mahalingam, Jim Ciston, Rohan Dhall, Robert J. Bondi, Matthew J. Marinella, Donald A. Telesca, Sabyasachi Ganguli

    Published 2023-01-01
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    Article
  2. 2
    Exfoliation procedure-dependent optical properties of solution deposited MoS2 films

    Exfoliation procedure-dependent optical properties of solution deposited MoS2 films by Robert T. Busch, Lirong Sun, Drake Austin, Jie Jiang, Paige Miesle, Michael A. Susner, Benjamin S. Conner, Ali Jawaid, Shannon T. Becks, Krishnamurthy Mahalingam, Michael A. Velez, Riccardo Torsi, Joshua A. Robinson, Rahul Rao, Nicholas R. Glavin, Richard A. Vaia, Ruth Pachter, W. Joshua Kennedy, Jonathan P. Vernon, Peter R. Stevenson

    Published 2023-02-01
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