Showing 1 - 1 results of 1 for search 'Sébastien Place', query time: 0.02s Refine Results
  1. 1
    Electrical Characterization of the Backside Interface on BSI Global Shutter Pixels with Tungsten-Shield Test Structures on CDTI Process

    Electrical Characterization of the Backside Interface on BSI Global Shutter Pixels with Tungsten-Shield Test Structures on CDTI Process by Célestin Doyen, Stéphane Ricq, Pierre Magnan, Olivier Marcelot, Marios Barlas, Sébastien Place

    Published 2020-01-01
    Get full text
    Article

Search Tools: