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    Analysis of the growth mechanisms of CO/Si(100)-(2×1)interface by UPS(CO在Si(100)表面生长的光电子谱研究)

    Analysis of the growth mechanisms of CO/Si(100)-(2×1)interface by UPS(CO在Si(100)表面生长的光电子谱研究) מאת BAODe-song(鲍德松), SHENHai-juan(沈海娟), ZHANGXun-sheng(张训生)

    יצא לאור 2000-11-01
    קבל טקסט מלא
    Article

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