CMOS SRAM circuit design and parametric test in nano-scaled technologies : process-aware sram design and test / por 235875 Pavlov, Andrei, Sachdev, Manoj

Thermal and power management of integrated circuits / por Vassighi, Arman, 1966-, Sachdev, Manoj

Defect-oriented testing for nano-metric CMOS VLSI circuits / por 175346 Sachdev, Manoj, De Gyves, Jpse Pineda

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ESD protection device and circuit design for advanced CMOS technologies / por 235848 Semenov, Oleg, Sarbishaei, Hossein, Sachdev, Manoj