Achieving microfocus of the 13.5-NM flash beam for exploring matter under extreme conditions 由 Nelson, A, Lee, R, Toleikis, S, Bajt, S, Fäustlin, R, Chapman, H, Krzywinski, J, Chalupsky, J, Juha, L, Hajkova, V, Nagler, B, Vinko, S, Whitcher, T, Wark, J, Dzelzainis, T, Riley, D, Saksl, K, Khorsand, A, Sobierajski, R, Jurek, M, Andreasson, J, Timneanu, N, Hadju, J, Fajardo, M, Tschentscher, T

Optical emission spectroscopy of various materials irradiated by soft x-ray free-electron laser 由 Cihelka, J, Juha, L, Chalupský, J, Rosmej, F, Renner, O, Saksl, K, Hájková, V, Vyšín, L, Galtier, E, Schott, R, Khorsand, A, Riley, D, Dzelzainis, T, Nelson, A, Lee, R, Heimann, P, Nagler, B, Vinko, S, Wark, J, Whitcher, T, Toleikis, S, Tschentscher, T, Fäustlin, R, Wabnitz, H, Bajt, S

Soft x-ray free electron laser microfocus for exploring matter under extreme conditions. 由 Nelson, A, Toleikis, S, Chapman, H, Bajt, S, Krzywinski, J, Chalupsky, J, Juha, L, Cihelka, J, Hajkova, V, Vysin, L, Burian, T, Kozlova, M, Fäustlin, R, Nagler, B, Vinko, S, Whitcher, T, Dzelzainis, T, Renner, O, Saksl, K, Khorsand, A, Heimann, P, Sobierajski, R, Klinger, D, Jurek, M, Pelka, J