Online condition monitoring of IGBT modules using voltage change rate identification by Pou, Josep, Mohamed Sathik, Mohamed Halick, Prasanth, S., Sasongko, Firman

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Comparative analysis of IGBT parameters variation under different accelerated aging tests by Sathik, Mohamed Halick Mohamed, Sundararajan, Prasanth, Sasongko, Firman, Pou, Josep, Natarajan, Sivakumar

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Comparative analysis of Si, SiC and GaN field-effect transistors for DC solid-state power controllers in more electric aircraft by Marwaha, Mridul, Sathik, Mohamed Halick, Satpathi, Kuntal, Yu, Yang, Sasongko, Firman, Pou, Josep, Gajanayake, Chandana, Gupta, Amit Kumar

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