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Virtual Metrology in Semiconductor Fabrication Foundry Using Deep Learning Neural Networks by Tze Chiang Tin, Saw Chin Tan, Ching Kwang Lee
Published 2022-01-01
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SDN architecture for UAVs and EVs using satellite: A hypothetical model and new challenges for future by Muhammad Reazul Haque, Saw Chin Tan, Zulfadzli Yusoff, Kashif Nisar, Ching Kwang Lee, BS Chowdhry, Sameer Ali, Shuaib K. Memona, Rizaludin Kaspin
Published 2021
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A Realizable Overlay Virtual Metrology System in Semiconductor Manufacturing: Proposal, Challenges and Future Perspective by Tze Chiang Tin, Saw Chin Tan, Hing Yong, Jimmy Ook Hyun Kim, Eric Ken Yong Teo, Ching Kwang Lee, Peter Than, Angela Pei San Tan, Siew Chee Phang
Published 2021-01-01
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The Implementation of a Smart Sampling Scheme C2O Utilizing Virtual Metrology in Semiconductor Manufacturing by Tze Chiang Tin, Saw Chin Tan, Hing Yong, Jimmy Ook Hyun Kim, Eric Ken Yong Teo, Joanne Ching Yee Wong, Ching Kwang Lee, Peter Than, Angela Pei San Tan, Siew Chee Phang
Published 2021-01-01
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Unprecedented smart algorithm for uninterrupted SDN services during DDoS attack by Muhammad Reazul Haque, Saw, Chin Tan, Zulfadzli Yusoff, Kashif Nisar, Rizaludin Kaspin, Iram Haider, Sana Nisar, Rodrigues, J. P. C., Bhawani Shankar Chowdhry, Muhammad Aslam Uqaili, Satya Prasad Majumder, Danda B. Rawat, Etengu, Richard, Rajkumar Buyya
Published 2021
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