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    Determining the C60 molecular arrangement in thin films by means of X-ray diffraction

    Determining the C60 molecular arrangement in thin films by means of X-ray diffraction nork Elschner, C, Levin, A, Wilde, L, Grenzer, J, Schroer, C, Leo, K, Riede, M

    Argitaratua 2011
    Journal article

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