Mechanism for secondary electron dopant contrast in the SEM by Sealy, C, Castell, M, Wilshaw, P

Application of secondary electron dopant contrast imaging to InP/InGaAsP laser structures by Sealy, C, Castell, M, Reynolds, C, Wilshaw, P

SEM imaging of contrast arising from different doping concentrations in semiconductors by Sealy, C, Castell, M, Wilkinson, A, Wilshaw, P