Impacts of Pulsing Schemes on the Endurance of Ferroelectric Metal–Ferroelectric–Insulator–Semiconductor Capacitors by Cheng-Hung Wu, Nicolo' Ronchi, Kuan-Chi Wang, Yu-Yun Wang, Sean Mcmitchell, Kaustuv Banerjee, Geert van Den Bosch, Jan van Houdt, Tian-Li Wu

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