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DeepCLEM: automated registration for correlative light and electron microscopy using deep learning [version 3; peer review: 1 approved, 2 approved with reservations] by Sebastian M. Markert, Sebastian Britz, Rick Seifert, Christian Stigloher, Philip Kollmannsberger, Veronika Perschin, Christoph Erbacher
Published 2023-12-01
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DeepCLEM: automated registration for correlative light and electron microscopy using deep learning [version 2; peer review: 1 approved, 2 approved with reservations] by Sebastian M. Markert, Sebastian Britz, Rick Seifert, Christian Stigloher, Philip Kollmannsberger, Veronika Perschin, Christoph Erbacher
Published 2022-08-01
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