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Sergei M. Ryndya
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Research of morphology and structure of 3C–SiC thin films on silicon by electron microscopy and X-ray diffractometry
by
Alexander S. Gusev
,
Sergei M. Ryndya
,
Andrei V. Zenkevich
,
Nikolai I. Kargin
,
Dmitrii V. Averyanov
,
Maksim M. Grekhov
Published 2015-12-01
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