Neural Compact Modeling Framework for Flexible Model Parameter Selection with High Accuracy and Fast SPICE Simulation by Seungjoon Eom, Hyeok Yun, Hyundong Jang, Kyeongrae Cho, Seunghwan Lee, Jinsu Jeong, Rock‐Hyun Baek

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Multi-Task Learning for Real-Time BSIM-CMG Parameter Extraction of NSFETs With Multiple Structural Variations by Seunghwan Lee, Seungjoon Eom, Jinsu Jeong, Junjong Lee, Sanguk Lee, Hyeok Yun, Yonghwan Ahn, Rock-Hyun Baek

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Modeling of 3D NAND Characteristics for Cross‐Temperature by Using Graph Neural Network and Its Application by Kyeongrae Cho, Jeong-Sik Lee, Chanyang Park, Hyeok Yun, Hyundong Jang, Seungjoon Eom, Min Sang Park, Hyun-Chul Choi, Rock-Hyun Baek

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Accurate Prediction and Reliable Parameter Optimization of Neural Network for Semiconductor Process Monitoring and Technology Development by Hyeok Yun, Chang-Hyeon An, Hyundong Jang, Kyeongrae Cho, Jeong-Sik Lee, Seungjoon Eom, Choong-Ki Kim, Min-Soo Yoo, Hyun-Chul Choi, Rock-Hyun Baek

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Nonlinear Variation Decomposition of Neural Networks for Holistic Semiconductor Process Monitoring by Hyeok Yun, Hyundong Jang, Seunghwan Lee, Junjong Lee, Kyeongrae Cho, Seungjoon Eom, Soomin Kim, Choong‐Ki Kim, Hong‐Chul Byun, Seongjoo Han, Min‐Soo Yoo, Rock‐Hyun Baek

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