Enhanced electric resistivity and dielectric energy storage by vacancy defect complex by Pan, Hao, Feng, Nan, Xu, Xing, Li, Weiwei, Zhang, Qinghua, Lan, Shun, Liu, Yi-Qian, Sha, Haozhi, Bi, Ke, Xu, Ben, Ma, Jing, Gu, Lin, Yu, Rong, Shen, Yang, Wang, Renshaw Xiao, MacManus-Driscoll, Judith L., Chen, Chong-Lin, Nan, Ce-Wen, Lin, Yuan-Hua

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