Machine vision inspection of early failure and line-shaped defects of blue InGaN/GaN light emitting diodes soaked in liquid nitrogen for cryogenic tests by Chun-Yen Yang, Chih-Yuan Yu, You-Li Lin, Mou-Tuong Hon, Shao-Jui Yang, Yi-Zong Zhang, Hsuan-Chia Kang, Yaw-Wen Kuo, Chia-Feng Lin, You-Lin Wu, Hsin-Hung Chou, Hsiang Chen, Yung-Hui Li, Jung Han

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