Showing 1 - 11 results of 11 for search 'Sima Dimitrijev', query time: 0.04s Refine Results
  1. 1
    The effect of wafer thinning and thermal capacitance on chip temperature of SiC Schottky diodes during surge currents

    The effect of wafer thinning and thermal capacitance on chip temperature of SiC Schottky diodes during surge currents by Jenny Damcevska, Sima Dimitrijev, Daniel Haasmann, Philip Tanner

    Published 2023-11-01
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  2. 2
    Electrically Active Defects in SiC Power MOSFETs

    Electrically Active Defects in SiC Power MOSFETs by Mayank Chaturvedi, Daniel Haasmann, Hamid Amini Moghadam, Sima Dimitrijev

    Published 2023-02-01
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  3. 3
    Improvement of channel-carrier mobility in 4H-SiC MOSFETs correlated with passivation of very fast interface traps using sodium enhanced oxidation

    Improvement of channel-carrier mobility in 4H-SiC MOSFETs correlated with passivation of very fast interface traps using sodium enhanced oxidation by Arnar M. Vidarsson, Daniel Haasmann, Sima Dimitrijev, Einar Ö. Sveinbjörnsson

    Published 2023-05-01
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  4. 4
    Circuit-Specific and Technology-Independent Criterion for Selection of Power MOSFETs That Minimize Energy Dissipation

    Circuit-Specific and Technology-Independent Criterion for Selection of Power MOSFETs That Minimize Energy Dissipation by Vikas Joshi, Utkarsh Jadli, Peyush Pande, Mayank Chaturvedi, Daniel Haasmann, Sima Dimitrijev

    Published 2023-01-01
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  5. 5
    A Figure of Merit for Selection of the Best Family of SiC Power MOSFETs

    A Figure of Merit for Selection of the Best Family of SiC Power MOSFETs by Mayank Chaturvedi, Sima Dimitrijev, Daniel Haasmann, Hamid Amini Moghadam, Peyush Pande, Utkarsh Jadli

    Published 2022-04-01
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  6. 6
    Direct Measurement of Active Near-Interface Traps in the Strong-Accumulation Region of 4H-SiC MOS Capacitors

    Direct Measurement of Active Near-Interface Traps in the Strong-Accumulation Region of 4H-SiC MOS Capacitors by Peyush Pande, Sima Dimitrijev, Daniel Haasmann, Hamid Amini Moghadam, Philip Tanner, Jisheng Han

    Published 2018-01-01
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  7. 7
    Fast Near-Interface Traps in 4H-SiC MOS Capacitors Measured by an Integrated-Charge Method

    Fast Near-Interface Traps in 4H-SiC MOS Capacitors Measured by an Integrated-Charge Method by Mayank Chaturvedi, Sima Dimitrijev, Hamid Amini Moghadam, Daniel Haasmann, Peyush Pande, Utkarsh Jadli

    Published 2021-01-01
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  8. 8
    Modeling Power GaN-HEMTs Using Standard MOSFET Equations and Parameters in SPICE

    Modeling Power GaN-HEMTs Using Standard MOSFET Equations and Parameters in SPICE by Utkarsh Jadli, Faisal Mohd-Yasin, Hamid Amini Moghadam, Peyush Pande, Mayank Chaturvedi, Sima Dimitrijev

    Published 2021-01-01
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  9. 9
    A Method for Selection of Power MOSFETs to Minimize Power Dissipation

    A Method for Selection of Power MOSFETs to Minimize Power Dissipation by Utkarsh Jadli, Faisal Mohd-Yasin, Hamid Amini Moghadam, Peyush Pande, Mayank Chaturvedi, Sima Dimitrijev

    Published 2021-09-01
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  10. 10
    Measurement of Power Dissipation Due to Parasitic Capacitances of Power MOSFETs

    Measurement of Power Dissipation Due to Parasitic Capacitances of Power MOSFETs by Utkarsh Jadli, Faisal Mohd-Yasin, Hamid Amini Moghadam, Peyush Pande, Jordan R. Nicholls, Sima Dimitrijev

    Published 2020-01-01
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  11. 11
    Observations of very fast electron traps at SiC/high-κ dielectric interfaces

    Observations of very fast electron traps at SiC/high-κ dielectric interfaces by Arnar M. Vidarsson, Axel R. Persson, Jr-Tai Chen, Daniel Haasmann, Jawad Ul Hassan, Sima Dimitrijev, Niklas Rorsman, Vanya Darakchieva, Einar Ö. Sveinbjörnsson

    Published 2023-11-01
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