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The digital method of surface reflectance coefficient measurement by Ivanchenko I. A., Santoniy V. I., Smyntyna V. A.
Published 2010-06-01
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Influence of polycrystalline silicon layer on flow through «metal — p-Si» contact by Smyntyna V. A., Kulinich O. A., Yatsunskii I. R., Sviridova O. V., Marchuk I. A.
Published 2011-11-01
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