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  1. 1
    Characterization of amorphous carbon films from 5 nm to 200 nm on single-side polished a-plane sapphire substrates by spectroscopic ellipsometry

    Characterization of amorphous carbon films from 5 nm to 200 nm on single-side polished a-plane sapphire substrates by spectroscopic ellipsometry by Ziqing Li, Ziqing Li, Ziqing Li, Changcai Cui, Changcai Cui, Xiaolong Zhou, Subiao Bian, Subiao Bian, Subiao Bian, Oriol Arteaga, Oriol Arteaga, Xipeng Xu, Xipeng Xu

    Published 2022-10-01
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    Article
  2. 2
    FDTD-Based Study on Equivalent Medium Approximation Model of Surface Roughness for Thin Films Characterization Using Spectroscopic Ellipsometry

    FDTD-Based Study on Equivalent Medium Approximation Model of Surface Roughness for Thin Films Characterization Using Spectroscopic Ellipsometry by Wanpei Yu, Changcai Cui, Huihui Li, Subiao Bian, Xi Chen

    Published 2022-08-01
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    Article

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