Embassies under siege : personal accounts by diplomats on the front line / by Sullivan, Joseph G.

Intelligent user interfaces / by Sullivan, Joseph W., Tyler, Sherman W.

Understanding the viability of impurity-band photovoltaics : a case study of S-doped Si by Sullivan, Joseph Timothy, Ph. D. Massachusetts Institute of Technology

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Density of Gabor Systems Via the Short Time Fourier Transform by Clark, William, Nitzan, Shahaf, Sullivan, Joseph, Ahn, Andrew Jeehyun

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Controlling dopant profiles in hyperdoped silicon by modifying dopant evaporation rates during pulsed laser melting by Recht, Daniel, Sullivan, Joseph Timothy, Reedy, Robert, Buonassisi, Tonio, Aziz, Michael J.

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Best Practices for Integrating Medical Students Into Telehealth Visits by Wamsley, Maria, Cornejo, Laeesha, Kryzhanovskaya, Irina, Lin, Brian W, Sullivan, Joseph, Yoder, Jordan, Ziv, Tali

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Room-temperature sub-band gap optoelectronic response of hyperdoped silicon by Hutchinson, David, Mathews, Jay, Sullivan, Joseph T., Recht, Daniel, Williams, James S., Warrender, Jeffrey M., Persans, Peter D., Aziz, Michael J., Mailoa, Jonathan P, Akey, Austin J, Simmons, Christine B, Sullivan, Joseph Timothy, Winkler, Mark Thomas, Buonassisi, Anthony

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Methodology for vetting heavily doped semiconductors for intermediate band photovoltaics: A case study in sulfur-hyperdoped silicon by Krich, Jacob J., Akey, Austin J., Recht, D., Aziz, Michael J., Sullivan, Joseph T., Simmons, Christie, Buonassisi, Tonio

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Extended infrared photoresponse and gain in chalcogen-supersaturated silicon photodiodes by Sullivan, Joseph Timothy, Buonassisi, Tonio, Said, Aurore J., Recht, Daniel, Warrender, Jeffrey M., Persans, Peter D., Aziz, Michael J.

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Deactivation of metastable single-crystal silicon hyperdoped with sulfur by Krich, Jacob J., Recht, Daniel, Aziz, Michael J., Akey, Austin J, Sullivan, Joseph Timothy, Buonassisi, Anthony, Simmons, Christie B.

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Supersaturating silicon with transition metals by ion implantation and pulsed laser melting by Recht, Daniel, Smith, Matthew J., Charnvanichborikarn, Supakit, Sullivan, Joseph T., Winkler, Mark T., Mathews, Jay, Warrender, Jeffrey M., Buonassisi, Tonio, Williams, James S., Gradecak, Silvija, Aziz, Michael J.

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Soft x-ray emission spectroscopy studies of the electronic structure of silicon supersaturated with sulfur by Winkler, Mark Thomas, Newman, Bonna Kay, Buonassisi, Tonio, Wilks, R. G., Weinhardt, L., Recht, D., Said, A. J., Zhang, Y., Blum, M., Krause, S., Yang, W. L., Heske, C., Aziz, Michael J., Bar, M., Sullivan, Joseph Timothy, Ph. D. Massachusetts Institute of Technology

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