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Phase shift reflectometry for wafer inspection by Peng, Kuang, Cao, Yiping, Li, Hongru, Sun, Jianfei, Bourgade, Thomas, Asundi, Anand Krishna
Published 2018
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Conference Paper -
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Privacy-aware and Security-enhanced efficient Matchmaking Encryption by Sun, Jianfei, Xu, Guowen, Zhang, Tianwei, Yang, Xuehuan, Alazab, Mamoun, Deng, Robert H. H.
Published 2023
Journal Article