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Controlled crack propagation for atomic precision handling of wafer-scale two-dimensional materials by Nezich, Daniel, Park, Yong Ju, Sundaram, Suresh, Li, Xin, Yue, Ruoyu, Zhou, Guanyu, Ahn, Jong-Hyun, Ougazzaden, Abdallah, Shim, Jaewoo, Bae, Sanghoon, Kong, Wei, Lee, DoYoon, Qiao, Kuan, Zhao, Ruike, Yeon, Hanwool, Choi, Chanyeol, Kum, Hyunseong, Ou, Yunbo, Lee, Kyusang, Moodera, Jagadeesh, Zhao, Xuanhe, Hinkle, Christopher W., Kim, Jeehwan
Published 2019
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