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Increasing the Accuracy of the Characterization of a Thin Semiconductor or Dielectric Film on a Substrate from Only One Quasi-Normal Incidence UV/Vis/NIR Reflectance Spectrum of th... by Dorian Minkov, George Angelov, Emilio Marquez, Rossen Radonov, Rostislav Rusev, Dimitar Nikolov, Susana Ruano
Published 2023-08-01
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