The effect of computer literacy instruction on teachers' knowledge of and attitudes toward microcomputers / par Madsen, Jane M, Lee, Ann Sebastiani

Focused ion beam ring drilling for residual stress evaluation par Korsunsky, A, Sebastiani, M, Bemporad, E

Focused ion beam ring drilling for residual stress evaluation par Korsunsky, A, Sebastiani, M, Bemporad, E

Preface: Virtual special issue on nanomechanical testing in materials research and development par Durst, K, Sebastiani, M, Korsunsky, A

Residual stress evaluation at the micrometer scale: Analysis of thin coatings by FIB milling and digital image correlation par Korsunsky, A, Sebastiani, M, Bemporad, E

Preface – Virtual special issue on nanomechanical testing in materials research and development par Molina-Aldareguia, JM, Sebastiani, M, Korsunsky, AM

On the measurement and interpretation of residual stress at the micro-scale par Korsunsky, A, Bemporad, E, Sebastiani, M, Hofmann, F, Dave, S

ON THE MEASUREMENT AND INTERPRETATION OF RESIDUAL STRESS AT THE MICRO-SCALE par Korsunsky, A, Bemporad, E, Sebastiani, M, Hofmann, F, Dave, S

A New Methodology For In-Situ Residual Stress Measurement In MEMS Structures par Sebastiani, M, Bemporad, E, Melone, G, Rizzi, L, Korsunsky, A

Discussion on "Interfacial Residual Stress Analysis of Thermal Spray Coatings by Miniature Ring-Core Cutting Combined with DIC Method" by JG Zhu et al., Experimental Mechanics DOI:... par Sebastiani, M, Korsunsky, A, Eberl, C, Bemporad, E, Pharr, G

Discussion on "Interfacial Residual Stress Analysis of Thermal Spray Coatings by Miniature Ring-Core Cutting Combined with DIC Method" by J.G. Zhu et al., Experimental Mechanics DO... par Sebastiani, M, Korsunsky, A, Eberl, C, Bemporad, E, Pharr, G

Generalised residual stress depth profiling at the nanoscale using focused ion beam milling par Salvati, E, Romano-Brandt, L, Mughal, M, Sebastiani, M, Korsunsky, A

Focused ion beam four-slot milling for Poisson's ratio and residual stress evaluation at the micron scale par Sebastiani, M, Eberl, C, Bemporad, E, Korsunsky, A, Nix, W, Carassiti, F

A review of experimental approaches to fracture toughness evaluation at the micro-scale par Ast, J, Ghidelli, M, Durst, K, Göken, M, Sebastiani, M, Korsunsky, A

Focused ion beam four-slot milling for Poisson's ratio and residual stress evaluation at the micron scale par Sebastiani, M, Eberl, C, Bemporad, E, Korsunsky, A, Nix, W, Carassiti, F

Nano-scale residual stress profiling in thin multilayer films with non-equibiaxial stress state par Sebastiani, M, Rossi, E, Mughal, MZ, Benedetto, A, Jacquet, P, Salvati, E, Korsunsky, AM

A critical comparison between XRD and FIB residual stressmeasurement techniques in thin films par Bemporad, E, Brisotto, M, Depero, L, Gelfi, M, Korsunsky, A, Lunt, A, Sebastiani, M

Being an agent or an observer: Different spectral dynamics revealed by MEG. par Sebastiani, V, de Pasquale, F, Costantini, M, Mantini, D, Pizzella, V, Romani, G, Della Penna, S

Residual stress measurement in thin films at sub-micron scale using Focused Ion Beam milling and imaging par Song, X, Yeap, K, Zhu, J, Belnoue, J, Sebastiani, M, Bemporad, E, Zeng, K, Korsunsky, A

Residual stress measurement in thin films using the semi-destructive ring-core drilling method using Focused Ion Beam par Song, X, Yeap, K, Zhu, J, Belnoue, J, Sebastiani, M, Bemporad, E, Zeng, K, Korsunsky, A