Showing 1 - 3 results of 3 for search 'Takeshi Kadono', query time: 0.02s Refine Results
  1. 1
    Reduction of White Spot Defects in CMOS Image Sensors Fabricated Using Epitaxial Silicon Wafer with Proximity Gettering Sinks by CH<sub>2</sub>P Molecular Ion Implantation

    Reduction of White Spot Defects in CMOS Image Sensors Fabricated Using Epitaxial Silicon Wafer with Proximity Gettering Sinks by CH<sub>2</sub>P Molecular Ion Implantation by Takeshi Kadono, Ryo Hirose, Ayumi Onaka-Masada, Koji Kobayashi, Akihiro Suzuki, Ryosuke Okuyama, Yoshihiro Koga, Atsuhiko Fukuyama, Kazunari Kurita

    Published 2022-10-01
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  2. 2
    TEM Image Analysis and Simulation Physics for Two-Step Recrystallization of Discretely Amorphized C<sub>3</sub>H<sub>5</sub>-Molecular-Ion-Implanted Silicon Substrate Surface

    TEM Image Analysis and Simulation Physics for Two-Step Recrystallization of Discretely Amorphized C<sub>3</sub>H<sub>5</sub>-Molecular-Ion-Implanted Silicon Substrate Surface by Koji Kobayashi, Ryosuke Okuyama, Takeshi Kadono, Ayumi Onaka-Masada, Ryo Hirose, Akihiro Suzuki, Yoshihiro Koga, Koji Sueoka, Kazunari Kurita

    Published 2024-01-01
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    Article
  3. 3
    Surface Recrystallization Model of Fully Amorphized C<sub>3</sub>H<sub>5</sub>-Molecular-Ion-Implanted Silicon Substrate

    Surface Recrystallization Model of Fully Amorphized C<sub>3</sub>H<sub>5</sub>-Molecular-Ion-Implanted Silicon Substrate by Koji Kobayashi, Ryosuke Okuyama, Takeshi Kadono, Ayumi Onaka-Masada, Ryo Hirose, Akihiro Suzuki, Sho Nagatomo, Yoshihiro Koga, Koji Sueoka, Kazunari Kurita

    Published 2024-08-01
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    Article

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