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    Probing buried interfaces in SiOxNy thin films via ultrafast acoustics: The role transducing layer thickness

    Probing buried interfaces in SiOxNy thin films via ultrafast acoustics: The role transducing layer thickness by Tauchmanová Martina, Mokrý Pavel, Kanclíř Vít, Václavík Jan, Veselá Petra, Žídek Karel

    Published 2023-01-01
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