The coefficient of variation chart with measurement error by Yeong, W.C., Khoo, M.B.C., Lim, S.L., Teoh, W.L.

Exact run length distribution of the double sampling x-bar chart with estimated process parameters by Teoh, W. L., Fun, M. S., Teh, S. Y., Khoo, Michael B. C., Yeong, W. C.

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EXACT RUN LENGTH DISTRIBUTION OF THE DOUBLE SAMPLING X CHART WITH ESTIMATED PROCESS PARAMETERS by Teoh, W. L., Fun, M. S., Teh, S. Y., Khoo, Michael B. C., Yeong, W. C.

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Performance comparison of the exact run-length distribution between the run sum X and EWMA X charts by Chong, J.K., Teoh, W.L., Khoo, Michael B.C., Chong, Z.L., Teh, S.Y.

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A comparison between the performances of double sampling X and variable sample size X charts by Teoh, W.L, Liow, K.L., Michael C. Khoo, B., Yeong, W.C., Teh, S.Y.

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Monitoring the Coefficient of Variation Using a Variable Sampling Interval EWMA Chart by Yeong, W.C., Khoo, M.B.C., Tham, L.K., Teoh, W.L., Rahim, M.A.