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    A Systematic Study of Compositionally Dependent Dielectric Tensors of SnS<i><sub>x</sub></i>Se<sub>1-<i>x</i></sub> Alloys by Spectroscopic Ellipsometry

    A Systematic Study of Compositionally Dependent Dielectric Tensors of SnS<i><sub>x</sub></i>Se<sub>1-<i>x</i></sub> Alloys by Spectroscopic Ellipsometry by Xuan Au Nguyen, Thi Minh Hai Nguyen, Tae Jung Kim, Long Van Le, Tung Hoang Nguyen, Bogyu Kim, Kyujin Kim, Wonjun Lee, Sunglae Cho, Young Dong Kim

    Published 2021-05-01
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