Time-resolved XRD experiments for a fine description of mechanisms induced during reactive sintering by Paris S., Gaffet E., Vrel D., Thiaudiere D., Gailhanou M., Bernard F.

Get full text

Stress evaluation in thin films: Micro-focus synchrotron X-ray diffraction combined with focused ion beam patterning for do evaluation by Baimpas, N, Le Bourhis, E, Eve, S, Thiaudière, D, Hardie, C, Korsunsky, A

Stress evaluation in thin films: Micro-focus synchrotron X-ray diffraction combined with focused ion beam patterning for d(o) evaluation by Baimpas, N, Le Bourhis, E, Eve, S, Thiaudiere, D, Hardie, C, Korsunsky, A

Feasibility study of synchrotron x-ray diffraction and absorption spectroscopy for the characterisation of NMC oxides for Li-ion battery cathodes by Kim, T, Bohang, S, Baimpas, N, Mocuta, C, Thiaudiere, D, Li, L, Korsunsky, A

Mechanical characterization of nanostructured thin films at different scales by Chiron R., Randriamazaoro R.N., Goudeau P., Le Bourhis E., Renault P.O., Geandier G., Thiaudière D., Djaziri S., Castelnau O., Faurie D., Hild F.

Get full text