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True 3D Nanometrology: 3D-Probing with a Cantilever-Based Sensor by Jan Thiesler, Thomas Ahbe, Rainer Tutsch, Gaoliang Dai
Published 2021-12-01
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2
Using a Tip Characterizer to Investigate Microprobe Silicon Tip Geometry Variation in Roughness Measurements by Min Xu, Ziqi Zhou, Thomas Ahbe, Erwin Peiner, Uwe Brand
Published 2022-02-01
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Long Slender Piezo-Resistive Silicon Microprobes for Fast Measurements of Roughness and Mechanical Properties inside Micro-Holes with Diameters below 100 µm by Uwe Brand, Min Xu, Lutz Doering, Jannick Langfahl-Klabes, Heinrich Behle, Sebastian Bütefisch, Thomas Ahbe, Erwin Peiner, Stefan Völlmeke, Thomas Frank, Bodo Mickan, Ilia Kiselev, Michael Hauptmannl, Michael Drexel
Published 2019-03-01
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