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Microstructure Evaluation and Impurities in La Containing Silicon Oxynitrides by Abbas Saeed Hakeem, Sharafat Ali, Thomas Höche, Qasem Ahmed Drmosh, Amir Azam Khan, Bo Jonson
Published 2021-07-01
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Heteroepitaxial Ge-on-Si by DC magnetron sputtering by Martin Steglich, Christian Patzig, Lutz Berthold, Frank Schrempel, Kevin Füchsel, Thomas Höche, Ernst-Bernhard Kley, Andreas Tünnermann
Published 2013-07-01
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