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Turning European XFEL raw data into user data by Philipp Schmidt, Karim Ahmed, Cyril Danilevski, David Hammer, Robert Rosca, Thomas Kluyver, Thomas Michelat, Egor Sobolev, Luca Gelisio, Luis Maia, Maurizio Manetti, Janusz Malka, Krzysztof Wrona, Jolanta Sztuk-Dambietz, Vratko Rovensky, Marco Ramilli, Nuno Duarte, David Lomidze, Ibrahym Dourki, Hazem Yousef, Björn Senfftleben, Olivier Meyer, Monica Turcato, Steffen Hauf, Steve Aplin
Published 2024-01-01
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Shock Damage Analysis in Serial Femtosecond Crystallography Data Collected at MHz X-ray Free-Electron Lasers by Alexander Gorel, Marie Luise Grünbein, Richard Bean, Johan Bielecki, Mario Hilpert, Michele Cascella, Jacques-Philippe Colletier, Hans Fangohr, Lutz Foucar, Elisabeth Hartmann, Mark S. Hunter, Henry Kirkwood, Marco Kloos, Romain Letrun, Thomas Michelat, Robert L. Shoeman, Jolanta Sztuk-Dambietz, Guillaume Tetreau, Herbert Zimmermann, Adrian P. Mancuso, Thomas R.M. Barends, R. Bruce Doak, Claudiu Andrei Stan, Ilme Schlichting
Published 2020-12-01
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Data reduction activities at European XFEL: early results by Egor Sobolev, Philipp Schmidt, Janusz Malka, David Hammer, Djelloul Boukhelef, Johannes Möller, Karim Ahmed, Richard Bean, Ivette Jazmín Bermúdez Macías, Johan Bielecki, Ulrike Bösenberg, Cammille Carinan, Fabio Dall’Antonia, Sergey Esenov, Hans Fangohr, Hans Fangohr, Danilo Enoque Ferreira de Lima, Luís Gonçalo Ferreira Maia, Hadi Firoozi, Gero Flucke, Patrick Gessler, Gabriele Giovanetti, Jayanath Koliyadu, Anders Madsen, Thomas Michelat, Michael Schuh, Marcin Sikorski, Alessandro Silenzi, Jolanta Sztuk-Dambietz, Monica Turcato, Oleksii Turkot, James Wrigley, Steve Aplin, Steffen Hauf, Krzysztof Wrona, Luca Gelisio
Published 2024-02-01
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