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    Measurement of Effects of Different Substrates on the Mechanical Properties of Submicron Titanium Nickel Shape Memory Alloy Thin Film Using the Bulge Test

    Measurement of Effects of Different Substrates on the Mechanical Properties of Submicron Titanium Nickel Shape Memory Alloy Thin Film Using the Bulge Test by Nhat Minh Dang, Zhao-Ying Wang, Ti-Yuan Wu, Tra Anh Khoa Nguyen, Ming-Tzer Lin

    Published 2021-01-01
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