A Comprehensive Review of Recent Progress on GaN High Electron Mobility Transistors: Devices, Fabrication and Reliability by Fanming Zeng, Judy Xilin An, Guangnan Zhou, Wenmao Li, Hui Wang, Tianli Duan, Lingli Jiang, Hongyu Yu

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Investigation of AlGaN/GaN HEMTs degradation with gate pulse stressing at cryogenic temperature by Ning Wang, Hui Wang, Xinpeng Lin, Yongle Qi, Tianli Duan, Lingli Jiang, Elina Iervolino, Kai Cheng, Hongyu Yu

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A novel fabrication technique for three-dimensional concave nanolens arrays by Tianli Duan, Kang Xu, Zhihong Liu, Chenjie Gu, Jisheng Pan, Diing Shenp Ang, Rui Zhang, Yao Wang, Xuhang Ma

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