Showing 1 - 2 results of 2 for search 'Tim, Wei Lun, 1992-, author', query time: 0.02s Refine Results
  1. 1
    Design for testability (DFT) method at register transfer level design for greatest common divisor (GCD) and finite impulse response (FIR) /

    Design for testability (DFT) method at register transfer level design for greatest common divisor (GCD) and finite impulse response (FIR) / by Tim, Wei Lun, 1992-, author, Norlina Paraman, supervisor, Fakulti Kejuruteraan Elektrik

    Published 2016
  2. 2
    Design for testability (DFT) method at register transfer level design for greatest common divisor (GCD) and finite impulse response (FIR) [electronic resource] /

    Design for testability (DFT) method at register transfer level design for greatest common divisor (GCD) and finite impulse response (FIR) [electronic resource] / by Tim, Wei Lun, 1992-, author, Norlina Paraman, supervisor, Fakulti Kejuruteraan Elektrik

    Published 2016

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