Adaptive Threshold Algorithm for Outlier Elimination in 3D Topography Data of Metal Additive Manufactured Surfaces Obtained from Focus Variation Microscopy por Xin Xu, Tobias Pahl, Sebastian Hagemeier, Peter Lehmann

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Low-Cost High-Speed Fiber-Coupled Interferometer for Precise Surface Profilometry por Sebastian Hagemeier, Yijian Zou, Tobias Pahl, Felix Rosenthal, Peter Lehmann

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Microsphere-assisted quantitative phase microscopy: a review por Vahid Abbasian, Tobias Pahl, Lucie Hüser, Sylvain Lecler, Paul Montgomery, Peter Lehmann, Arash Darafsheh

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